Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)
- 2000.11d
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- Pages.223-226
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- 2000
A Visual Inspection System for Printing Detects using Perimetric Mask and Generalized Symmetry Transform Algorithm
주변 마스크와 일반화 대칭변환 알고리듬을 이용한 인쇄물 검사 시스템
Abstract
In this paper, we report detects system algorithm, adapted a perimetric mask and a generalized symmetry system, to detect a transformable material and find out a minute error cannot be noticed by a naked eye. In this thesis, supposed a stable detecting system applied a general image processing theory and perimetric mash algorithm to detect badness. And finally, detected some vague errors with the application of symmetry transform algorithm that accumulate a symmetry of minute error and put stress on it.
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