대한전자공학회:학술대회논문집 (Proceedings of the IEEK Conference)
- 대한전자공학회 2000년도 하계종합학술대회 논문집(2)
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- Pages.52-55
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- 2000
P-채널 플래시메모리의 온도에 따른 특성 변화
P-channel flash memory characteristics with elevated temperatures
초록
The temperature effects of programming speed and endurance characteristics in p-channel flash memory cell have been investigated. In the case of room temperature, the programming speed of p-channel flash memory by using BTB scheme is faster than that by using CHE scheme. However, endurance characteristics with BTB programming scheme is not better than that with CHE programming scheme. In the case of elevated temperature, CHE programming speed is reduced due the gate current degradation but BTB programming speed is enhanced due to the increasing of gate current. Finally, the endurance characteristics of both schemes are improved due to the reduction of gate oxide traps.
키워드