SUBMICRON-RESOLUTION DOMAIN REVERSAL STUDY OF Co-BASED MULTILAYERS USING MAGNETO-OPTICAL MICROSCOPE MAGNETOMETER (MOMM)

  • Shin, Sung-Chul (Department of Physics and Center for Nanospinics of Spintronic Materials Korea Advanced Institute of Science and Technology) ;
  • Choe, Sug-Bong (Department of Physics and Center for Nanospinics of Spintronic Materials Korea Advanced Institute of Science and Technology)
  • 발행 : 2000.09.01

초록

A novel system of magneto-optical microscope magnetometer (MOMM), capable of simultaneous local problems of magnetic properties as well as real-time magnetic domain evolution imaging of ferromagnetic thin films with 400-nm spatial resolution, New findings in domain reveral dynamics of Co-based multilayers: The reversal ratio of V/R is a governing physical parameter. The activation volumes of wall-motion and nucleation processes are generally unequal. Submicron-scale local coercivity variation determines domain reversal dynamics. A thermally activated relaxation process during domain reversal is existed on the submicron-scale in realistic films. Local variation of magnetic properties should be considered for a realistic simulation. The fantastic capabilities of the MOMM can open many possibilities to broaden and deepen our understanding of domain reversal phenomena in ferromagnetic thin films.

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