Proceedings of the Materials Research Society of Korea Conference (한국재료학회:학술대회논문집)
- 2000.11a
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- Pages.41-41
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- 2000
Dielectric anomaly of strained $(Ba_{0.5}, Sr_{0.5}}TiO_3$ thin films epitaxially grown on Si substrate
Si 기판위에 성장된 에피텍셜 $(Ba_{0.5}, Sr_{0.5}}TiO_3$ 박막의 잔류응력에 따른 유전특성변화
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