한국정밀공학회:학술대회논문집 (Proceedings of the Korean Society of Precision Engineering Conference)
- 한국정밀공학회 2000년도 추계학술대회 논문집
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- Pages.239-242
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- 2000
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- 2005-8446(pISSN)
기상측정 시스템을 위한 일반형상 측정 모듈 개발
Development of an Analytic Surface Measurement Module for OMM System
초록
The purpose of this paper is to establish an effective inspection system by using OMM(ON-Machine Measurement) system. This allows us to reduce the manufacturing lead time by separating the inspection process from manufacturing system. As a first step, the inspection process planning is accomplished by determining the number of measuring points, their locations, measuring path and their sequence. Subsequently, we generate measuring G-codes to be transferred to the machining center through RS232C, and then the inspection process will be performed for each shape. Analysing obtained measuring data, the dimensional tolerance will be validated.