Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 2000.07a
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- Pages.134-136
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- 2000
A study on TRV generating circuit in short-circuit tests
단락시험에서의 과도회복전압발생회로에 관한 연구
- Kim, Maeng-Hyun (Testing & Industrial Service Center of Korea Electrotechnology Research Institute) ;
- Suh, Yoon-Teak (Testing & Industrial Service Center of Korea Electrotechnology Research Institute) ;
- Yoon, Hack-Dong (Testing & Industrial Service Center of Korea Electrotechnology Research Institute) ;
- Kang, Young-Sik (Testing & Industrial Service Center of Korea Electrotechnology Research Institute) ;
- Kho, Hee-Seog (Department of Electrical & Electronics Engineering of Kyung Nam University)
- Published : 2000.07.17
Abstract
This paper deals with the analysis on the TRV generating circuit and the TRV waveform occurred from the short-circuit tests using only the short-circuit generator. And the results of analysis on the proposed TRV generating circuit and TRV measured are described.
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