Microwave-Induced Negative-Differential Resistance Observed in Josephson Junction

마이크로파가 조셉슨 접합에서 유발하는 부의 미분저항

  • Kim, Kyu-Tae (Electricity Group, Korea Research Institute of Standards and Science) ;
  • Koutovoi, Viatcheslav D. (National Scientific and Research Institute for Physical Technical and Radiotechnical Measurements(VNIIFTRI), Russia) ;
  • Hong, Hyun-Kwon (Chungbuk University)
  • Published : 1999.08.18

Abstract

We have observed that a stable and reproducible Negative Differential Resistance(NDR) is induced by external microwave at low power in Nb/AlO$_x$/Al/Alo$_x$/Nb junctions. To study the erratic and pozzling NDR observations we have simulated Stewart-McCumber model in the region. Experimental results and simulation results will be presented with a discussion to draw a dynamic interpreration of the NDR.

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