Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 1999.07d
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- Pages.1777-1779
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- 1999
Observation of Electrical and Optical Images of Organic Thin Films Using SPM
SPM을 이용한 유기박막의 전기.광학 이미지 관찰
- Yoo, Seung-Yeop (Dept. of Electrical Eng., Dong-A University) ;
- Lee, Seung-Jun (Dept. of Electrical Eng., Dong-A University) ;
- Jin, Chel-Nam (Dept. of Electrical Eng., Dong-A University) ;
- Shin, Hoon-Kyu (Dept. of Electrical Eng., Dong-A University) ;
- Kwon, Young-Soo (Dept. of Electrical Eng., Dong-A University)
- Published : 1999.07.19
Abstract
SMM is a dynamic noncontact electric force microscopy that allows simultaneous access to the electrical properties of molecular system such as surface potential, surface charge, dielectric constant and conductivity along with the topography. SNOAM is a new tool for surface imaging which was introduced as one application of AFM. Operated with non-contact forces between the optical fiber and sample as well as equipped with the piezoscanners, the instrument reports on surface topology without damaging or modifying the surface for measuring of optical characteristic in the films. Here we report our recent results of its application to nanoscopic study of domain structures and electrical functionality in organic thin films by SMM. Furthermore, we have illustrated the SNOAM image in obtaining the merocyanine dye films as well as the optical image.
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