CHARACTERIZATION AHD FORMATION OF METAL/FEERRO-ELECTRIC/INSULAT0R/SEMICONDUCTOR(MFIS) STRUCTURE WITH A SPIN-ON GLASS AND $Ta_2O_3$ FILM AS THE BUFFER LAYER

  • Choi, Yeon-H. (Dept. of Electronic Engineering, The University of Seoul) ;
  • Kim, C.J. (Dept. of Electronic Engineering, The University of Seoul)
  • Published : 1998.08.01