REFINEMENT ON CHARACTERIATION OF ARTIFICIAL SUPERSTRUCTURE FROM X-RAY DIFFRACTION

  • Ishibashi, Yurika (Dept. of Inorg. Mater., Tokyp Inst. Tech.) ;
  • Tsurumi, T. (Dept. of Inorg. Mater., Tokyp Inst. Tech.) ;
  • Ohashi, N. (Dept. of Inorg. Mater., Tokyp Inst. Tech.)
  • Published : 1998.08.01