In-situ x-ray scattering studies of AIN thin films on sapphire substrates by RF magnetron sputtering

  • Soe, S.H. (Deppartmeno of Materials Science and Engineering) ;
  • M.S.Yi (Center for Electronic materials Rescarch) ;
  • H. C. Kang (Kwangju Institute of Science) ;
  • D. Y. Noh (Techology Kwangju, korea)
  • Published : 1998.02.01