Effect of composition and structure on exchange anisotropy of IrxMn(100-x)/NiFe films

  • Suh, Su-jung (Department of Metallurgy, Sung Kyun Kwan University) ;
  • Park, Young-suk (Department of Metallurgy, Sung Kyun Kwan University) ;
  • Ro, Jae-chul (Department of Metallurgy, Sung Kyun Kwan University) ;
  • Yong-sung (Department of Metallurgy, Sung Kyun Kwan University) ;
  • Yoon, Dae-ho (Department of Metallurgy, Sung Kyun Kwan University)
  • 발행 : 1998.06.01

초록

Exchange anisotropy between IrMn antiferromagnetic layer and NiFe ferromagnetic layer has been studied in IrxMn(100-x)/NiFe/Buffr/Si(100) films deposited by D. C. magnetron sputtering method. Among Zr, Ta, and Cu used as buffer layer, Zr and Ta enhanced the fcc(111) texture of NiFe and IeMn layer, but Cu did not affect microstructure of those layer. Strong fcc(111) texture of IrMn layer was confirmed to be the origin of exchange anisotropy of IrMn. Ir composition control in IrMn layer showed that {{{{ gamma -phase}}}} IrMn is stabilized between 10 and 30 at % Ir, an 21 at. % Ir in IrMn layer was optimum composition that showed maximum exchange anisotropy field. above 200 ${\AA}$ thickness of IrMn, antiferromagnetic property is stabilzed to show saturated exchange anisotropy field. Based pressure was confirmed to be critical requisite in IrMn-based spin-valve GMR system.

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