Proceedings of the KIPE Conference (전력전자학회:학술대회논문집)

The Korean Institute of Power Electronics (전력전자학회)
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DESIRABLE PARAMETER IDENTIFICATION FOR THE IMPLEMENTATION OF IDEAL PASSIVE FAULT CURRENT LIMITER FOR THE PROTECTION OF POWER SEMICONDUCTOR DEVICES

  • Mukhopadhyay, S.C. (Laboratory of Magnetic Field Control and Applications, Faculty of Engineering, Kanazawa University) ;
  • Iwahara, M. (Laboratory of Magnetic Field Control and Applications, Faculty of Engineering, Kanazawa University) ;
  • Yamada, S. (Laboratory of Magnetic Field Control and Applications, Faculty of Engineering, Kanazawa University) ;
  • Dawson, F.P. (Department of Electrical and Computer Engineering University of Toronto)
  • Published : 1998.10.01
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Abstract

Compact and small size, reliable and failsafe operation and low cost featuring fault current limiter causing the designer to take a close look into the use of passive fault current limiter(FCL) for the protection of power semiconductor devices in power electronic systems. This paper has identified the main parameters responsible for the development of ideal passive magnetic current limiter. The effect of those parameters on the range of operation and the voltage-current characteristics of the magnetic current limiter has been studied using tableau approach. Desirable characteristics are discussed and the simulation results are presented.

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