전력전자학회:학술대회논문집 (Proceedings of the KIPE Conference)
- 전력전자학회 1998년도 Proceedings ICPE 98 1998 International Conference on Power Electronics
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- Pages.246-251
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- 1998
UNCONVENTIONAL TESTER FOR THE VERIFICATION OF GTO-MODEL-PARAMETERS AND FOR THE INVESTIGATION FO THE CURRENT DENSITY DISTRIBUTION IN GTO TABLETS
- Henry G ldner (Dresden University of Technology, Chair of Power Electronic) ;
- Andreas Thiede (Dresden University of Technology, Chair of Power Electronic) ;
- Lutz G hler (University of Bundeswehr Munich) ;
- Schulze, Hans-Joachim (Siemens AG, Corporate Research and Development Department) ;
- Jakob Sigg (Siemens AG, Corporate Research and Development Department) ;
- Johann Otto (Siemens AG, Corporate Research and Development Department) ;
- Dieter Metzner (eupec GmbH+Co.KG)
- 발행 : 1998.10.01
초록
This paper describes the main features of an unconventional tester for high power semiconductor devices. Two application ranges are highlighted. The tester is used for the extraction of GTO parameters and their verification by measurements. The second field comprises the determination of the radial and azimuthal current density distribution of a GTO tablet. The results are compared with the carrier lifetime distribution.
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