Proceedings of the KIPE Conference (전력전자학회:학술대회논문집)

The Korean Institute of Power Electronics (전력전자학회)
권호 표지

UNCONVENTIONAL TESTER FOR THE VERIFICATION OF GTO-MODEL-PARAMETERS AND FOR THE INVESTIGATION FO THE CURRENT DENSITY DISTRIBUTION IN GTO TABLETS

  • Henry G ldner (Dresden University of Technology, Chair of Power Electronic) ;
  • Andreas Thiede (Dresden University of Technology, Chair of Power Electronic) ;
  • Lutz G hler (University of Bundeswehr Munich) ;
  • Schulze, Hans-Joachim (Siemens AG, Corporate Research and Development Department) ;
  • Jakob Sigg (Siemens AG, Corporate Research and Development Department) ;
  • Johann Otto (Siemens AG, Corporate Research and Development Department) ;
  • Dieter Metzner (eupec GmbH+Co.KG)
  • Published : 1998.10.01
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Abstract

This paper describes the main features of an unconventional tester for high power semiconductor devices. Two application ranges are highlighted. The tester is used for the extraction of GTO parameters and their verification by measurements. The second field comprises the determination of the radial and azimuthal current density distribution of a GTO tablet. The results are compared with the carrier lifetime distribution.

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