Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 1998.07d
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- Pages.1475-1477
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- 1998
A Study on Estimation of Life-time under Semiconducting Layer/Needle Electrode in XLPE
반도전층/침전극하에서 XLPE의 수명시간예측
- Oh, Ja-Hyung (School of Electrical and Electronic Engineering Wonkwang University) ;
- Kim, Sung-Tak (School of Electrical and Electronic Engineering Wonkwang University) ;
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Park, Dae-Hee
(School of Electrical and Electronic Engineering Wonkwang University)
- Published : 1998.07.20
Abstract
In this paper, breakdown strength and time to breakdown are experimented under semiconducting layer/needle electrode in XLPE which is used for power cable insulator. Shape and scale parameters of obtained data are estimated using 2-parameters Weibull distribution. Life-time coefficient(n-value) using shape parameters for breakdown strength and time to breakdown tests is estimated. n-value of 1000 hour aged XLPE showed higher value than that of virgin XLPE. Increase of n-value is estimated by the stability due to removal of by-product and residue gas in XLPE by heating.
Keywords