Analysis of corrosion on the Al(Cu 1%) surface using XPS

  • Kim Sang-Gi (Electronics and Telecommunications Research Institute, Taejon, 305-600, Korea) ;
  • Baek Kyu-Ha (Electronics and Telecommunications Research Institute, Taejon, 305-600, Korea) ;
  • Kwon kwang-Ho ;
  • Kim Chang-Il (Deppartment of Electrical Engineering, Anyang University, Kyunggi-Do, 430-714, Korea) ;
  • Jin (Electronics and Telecommunications Research Institute, Taejon, 305-600, Korea)
  • 발행 : 1997.02.01