Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 1997.07a
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- Pages.260-263
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- 1997
Calculation of Critical Current Density Degradation in the HTS Magnet due to Mechanical Strain
고온초전도마그네트 내부의 스트레인에 의한 임계전류밀도 감소 계산
- Lee, In-Kyu (Departmant of Electrical Engineering, Sung Kyun Kwan University) ;
- Nah, Wan-Soo (Departmant of Electrical Engineering, Sung Kyun Kwan University)
- Published : 1997.07.21
Abstract
In this paper, we describe the mechanical strain effects on the critical current density of HTS (BSCCO) pancake-type-magnet. Firstly the strain of pancake coil is calculated in terms of coil length, which is also a function of angle, and then the critical current density degradation due to strain is calculated along the coil. We assumed that the critical current density degradation pattern is same with that of
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