Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 1997.07d
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- Pages.1274-1276
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- 1997
The Crystallization Properties of $Te_x(Sb_{85}Ge_{15})_{100-x}$ Thin films for High Contrast Ratio and Low Loss Optical Recording
고대비.저손실 광기록을 위한 $Te_x(Sb_{85}Ge_{15})_{100-x}$ 박막의 결정화 특성
- Kim, Jong-Ki (Dept. of Electronic Materials Eng., Kwangwoon Univ.) ;
- Kim, Hong-Seok (Dept. of Electronic Materials Eng., Kwangwoon Univ.) ;
- Lee, Hyun-Yong (Institute of New Technology, Kwangwoon Univ.) ;
- Chung, Hong-Bay (Dept. of Electronic Materials Eng., Kwangwoon Univ.)
- Published : 1997.07.21
Abstract
We have investigated the crystallization properties of
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