Proceedings of the Korean Vacuum Society Conference (한국진공학회:학술대회논문집)
- 1996.02a
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- Pages.168-168
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- 1996
Polymer Surface Characterization Using Time-of-Flight Secondary Ion Mass Spectrometry
- Lee, Yeon-Hee (Advanced Analysis Center, Korea Institute of Science and Technology) ;
- Han, Seung-Hee (Advanced Analysis Center, Korea Institute of Science and Technology)
- Published : 1996.02.01
Abstract
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