Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)

The Korean Institute of Electrical Engineers (대한전기학회)
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Optical and electrical properties of the PAAS L films and LB films observed by BAM

BAM으로 관측한 PAAS L막의 특성 및 LB막의 광학적, 전기적 특성에 관한 연구

  • Lee, Seung-Yop (School of Electronics & Electrical Engineering, Hong-Ik University) ;
  • Kim, Tae-Wan (Department of Physics, Hong-Ik University) ;
  • Kang, Dou-Yol (School of Electronics & Electrical Engineering, Hong-Ik University)
  • 이승엽 (홍익대학교 공과대학 전자전기공학부) ;
  • 김태완 (홍익대학교 물리학과) ;
  • 강도열 (홍익대학교 공과대학 전자전기공학부)
  • Published : 1996.07.22
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Abstract

Brewster angle microscopy(BAM) makes it possible to measure domains of Langmuir films. Especially, formation and phase transition of the PAAS Langmuir monolayers from a gas phase to a solid phase at the air-water interface were observed by the use of BAM. And also we observed the comparative images of films deposited at each phase. The UV/visible absorption spectra of this films showed molecular intensity and aggregation at each state. The electrical properties of this material were measured by current-voltage(I-V) characteristics.

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