Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 1996.07c
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- Pages.1466-1468
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- 1996
A study on dielectric loss tangent measurement with $Al_{2}O_{3}$ crystal
$Al_{2}O_{3}$ crystal의 유전손실계수 측정에 관한 연구
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Lee, Jong-Chan
(Wonkwang University) ;
- Lin, Yea-Hoon (Wonkwang University) ;
- Lee, Rae-Duk (Korea Research Institute of Standards and Science) ;
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Park, Dae-Hee
(Wonkwang University)
- Published : 1996.07.22
Abstract
The standards of the capacitance arc measured and analyzed by the dry nitrogen or mica film as a dielectric. In this paper, respectively the standard capacitors of 10 pF and 100 pF for the establishment of the dielectric loss tangent are made by
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