한국전자현미경학회:학술대회논문집

Korean Society of Microscopy (한국현미경학회)
권호 표지

Measurement of Lattice Parameter of Primary Si Crystal in Stircasting by CBED Method

  • Kim, Soo-Chul (Advanced Analysis Center) ;
  • Lee, Jung-Ill (Division of Metals / Korea Institute of Science & Technology) ;
  • Kim, Gyeung-Ho (Division of Metals / Korea Institute of Science & Technology) ;
  • Lee, Ho-In (Division of Metals / Korea Institute of Science & Technology)
  • Published : 1995.06.01
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