레이저 다이오드의 코팅된 단면의 반사율 측정에 사용되는 문턱전류비에 관한 연구

A study on the threshold current ratio method using the measurement of coated facet reflectivity of a laser diode

  • 이상무 (숭실대학교 전자공학과) ;
  • 김부균 (숭실대학교 전자공학과)
  • 발행 : 1995.11.18

초록

We propose the improved threshold current ratio method to determine the reflectivity of coated facets. The carrier recombination time used in the improved threshold current ratio method depends on the value of facet reflectivities. However, the carrier recombination time used in the conventional threshold current ratio method is constant regardless of facet reflectivities. The difference between the results of the two methods increases as the reflectivity of a coated facet decreases.

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