The Deposition of Aluminum Thin Films for Mirror Reflection Films and fits Properties

미러용 반사막을 위한 알루미늄 박막의 증착과 그 특성

  • 김춘곤 (동서공과대학교 전자공학과) ;
  • 정귀상 (동서공과대학교 전자공학과)
  • Published : 1995.11.01

Abstract

Physical, electrical and optical properties of Aluminum(Al) thin films were investigated in order to establish the optimum sputtering parameters in mirror reflection films. Al. thin films deposited on corning glass substrate by DC magnetron sputtering were grown as a variation of the input power, operation pressure and deposition time. The properties of the Al thin films have been discussed by deposition rate, SEM, XRD, sheet resistivity, resistivity and reflectance. Al thin films were obtained at the deposition conditions as follows: operating pressure, 3 mtorr; DC input power desnsitiy, 3W/$\textrm{cm}^2$.

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