Capacitance Measurement for Electron Transpport Characterization

  • Khang, Y (Deppartment of Physics, Seoul National University) ;
  • Mang, K.M. (Deppartment of Electronic Engineering, Seoul National University) ;
  • Park, Y.J. (Deppartment of Electronic Engineering, Seoul National University) ;
  • Kuk, Y. (Deppartment of Electronic Engineering, Seoul National University)
  • 발행 : 1995.02.01