A study on the microstructure of SiGe films grown on Si substrate by MBE and SppE method

MBE와 SPE 방법으로 Si 기판위에 성장된 SiGe에피층의 미세구조 연구

  • Kim, Sang-Gi (Electronics And Telecommunications Research Institute) ;
  • Nam, San (Electronics And Telecommunications Research Institute) ;
  • Jo, Gyeong-Ik (Electronics And Telecommunications Research Institute) ;
  • Yun, Seon-Jin (Electronics And Telecommunications Research Institute) ;
  • Baek, Jong-Tae (Electronics And Telecommunications Research Institute) ;
  • Bae, In-Ho (Dept.of Physics, Yeungnam University)
  • 김상기 (한국전자통신연구소 반도체연구단) ;
  • 남산 (한국전자통신연구소 반도체연구단) ;
  • 조경익 (한국전자통신연구소 반도체연구단) ;
  • 윤선진 (한국전자통신연구소 반도체연구단) ;
  • 백종태 (한국전자통신연구소 반도체연구단) ;
  • 배인호 (영남대학교 물리학과)
  • Published : 1995.02.01