Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 1995.07c
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- Pages.1088-1092
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- 1995
The Study on a sensitive current limiting breaking device using RF Sputtering
RF Sputtering을 이용한 전류 민감성 차단 디바이스에 관한 연구
- Lee, S.H. (ChungNam National University) ;
- Jeong, K.H. (ChungNam National University) ;
- Park, D.K. (ChungNam National University) ;
- Kim, Y.L. (ChungNam National University) ;
- Lee, J.C. (ChungNam National University) ;
- Koo, K.W. (YoungDong Institute of Technology) ;
- Han, S.O. (ChungNam National University)
- Published : 1995.07.20
Abstract
In this paper, we evaluated the sputter-deposited Cr/Cu thin film fuses on
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