Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 1994.11a
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- Pages.59-64
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- 1994
A Study on the Si-SiO$_2$ Interface Traps of the Degraded SONOSFET Nonveolatile Memories with the Charge Pumping Techniques
Charge Pumping 기술을 응용한 열화된 SONOSFET 비휘발성 기억소자의 Si-SiO$_2$ 계면트랩에 관한 연구
Abstract
The Si-SiO
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