Proceedings of the Korean Vacuum Society Conference (한국진공학회:학술대회논문집)
- 1994.06a
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- Pages.94-96
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- 1994
Characterization of the MBE Grown AlGaAs Eppitaxial Layer using pphoto-luminescence and Double Crystal X-ray Diffractormeter Mapping Techniques
광류미느센스와 쌍결정엑스선 회절 mapping 방법을 이용한 MBE 성장된 AlGaAs 에피층의 특성 분석
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