대한전기학회:학술대회논문집 (Proceedings of the KIEE Conference)
- 대한전기학회 1994년도 하계학술대회 논문집 A
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- Pages.122-124
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- 1994
전자기 비파괴검사의 소개
Introduction to Electromagnetic Nondestructive Testing
- 신영길 (군산대학교 전기공학과)
- Shin, Young-Kil (Dept. of Electrical Eng., Kunsan National University)
- 발행 : 1994.07.21
초록
The purpose of this paper is to attract electrical and electronic engineering community's attention to electromagnetic nondestructive testing (NDT). Various electromagnetic NDT methods of detecting defects in materials are presented to help understand the underlying physics associated with these techniques. This understanding would provide a way to interpret the test signal to describe about the defect. In the meantime, the author hopes, one may realize how perfectly fit such a subject as electromagnetic NDT is to current curriculums of electrical and electronic engineering.
키워드