과도 해석 시뮬레이션을 위한 IGBT소자의 논리적인 모델링

Analytical Modeling of the IGBT Device for Transient Analysis Simulation

  • 서영수 (명지대학교 공과대학 전기공학과) ;
  • 장성철 (명지대학교 공과대학 전기공학과) ;
  • 김영춘 (명지대학교 공과대학 전기공학과) ;
  • 조문택 (명지대학교 공과대학 전기공학과) ;
  • 서수호 (명지대학교 공과대학 전기공학과)
  • Seo, Yong-Soo (Department of Electrical Engineering, Myong-Ji University) ;
  • Jang, Seong-Chil (Department of Electrical Engineering, Myong-Ji University) ;
  • Kim, Yong-Chun (Department of Electrical Engineering, Myong-Ji University) ;
  • Cho, Moon-Taek (Department of Electrical Engineering, Myong-Ji University) ;
  • Seo, Soo-Ho (Department of Electrical Engineering, Myong-Ji University)
  • 발행 : 1993.11.26

초록

The IGBT(Insulated Gate Bipolar Transistor) is a power semiconductor device that has gained acceptance among power electronic circuit design engineers for motor drive and Power converter applications. The device-circuit interaction of power insulated gate bipolar transistor for a series-inductor load, both with and without a snubber are, simulated. An analytical model for the transient operation of the IGBT is used in conjunction with the load circuit state equations for the simulations.

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