Structural Studies of InGaAS/Inpp Quantum Well using TEM

  • Nahm, Sahn (Materials & Characterization Section, Semiconductor Div. ETRI) ;
  • Oh, D.K. (Opptical-electronic Section, Semiconductor Div. ETRI) ;
  • Paek, M.C. (Materials & Characterization Section, Semiconductor Div. ETRI) ;
  • Kwon, O.J. (Materials & Characterization Section, Semiconductor Div. ETRI)
  • Published : 1993.02.01