Fault detection of logic circuit by use of M-sequence correlation method

In this paper, the estimation of the structure of a logic circuit under test is made from the observation of the input-output correlation function by use of M-sequence, from which we can estimate whether or not any fault exist in the logic circuit. Especially, investigation was made in case of the 2_stage logic circuit. We checked theoretically the sequence of correlation function, and we have shown that the correlation function is a function of period of M-sequence only, land the appearing number of correlation function in a period is a constant value depending on the logic circuit only. And by computer simulations we have shown that the structure of the circuit under test can be estimated from the observation of sequence of correlation function.