A Study on the modelling of DI Switching Device by FEM

DI 스위칭 소자의 Turn on 특성에 관한 연구

  • Published : 1993.07.18

Abstract

Double Injection(DI) switching devices consist of p+ and n+ contact separated by a nearly intrinsic semiconductor region containing deep trap. The FEM is chosen as a simulation method for DI switching device, because of the advantage in local mesh refinement and computer memory comparing with other methods. And Scharfetter-Gummel(S-G) scheme is applied, with which an accurate-seven point Gaussian Quadrature rule is combined. The existance of deed trap requires the modification of conventional equation set. So recombination rate equation is modified and a new equation is included in the equation set which conventionally consists of Poisson equation and current continuity equations.

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