한국전자현미경학회:학술대회논문집

Korean Society of Microscopy (한국현미경학회)
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Unstability of IV-VI Compound Semiconductor

  • Nahm, Sahn (Materials & Characterization Section, Semiconductor Technology Div. Electronics and Telecommuncations Research Institute) ;
  • Paek, Mun-Cheol (Materials & Characterization Section, Semiconductor Technology Div. Electronics and Telecommuncations Research Institute) ;
  • Kwon, Oh-Joon (Materials & Characterization Section, Semiconductor Technology Div. Electronics and Telecommuncations Research Institute)
  • Published : 1992.05.01
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