Proceedings of the Korean Society of Precision Engineering Conference (한국정밀공학회:학술대회논문집)
- 1992.10a
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- Pages.293-297
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- 1992
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- 2005-8446(pISSN)
다층퍼셉트론을 이용한 절삭칩 형상과 채터검출에 관한 연구
Abstract
For the computerized monitoring and diagnosis of the undesirable chip chatter which are major obstacles to FMS, a pattern recognition system based on multi-layer perception neural network is developed and the performance of the system is experimentally evaluated. Experimental results show that recognition of the two class state of normal or abnormal cutting gives satisfactory results with success rate of 81`91%. Therefore, the proposed system has possibility for use in monitoring and diagnosis of automatic manufacturing system
Keywords