다층퍼셉트론을 이용한 절삭칩 형상과 채터검출에 관한 연구

For the computerized monitoring and diagnosis of the undesirable chip chatter which are major obstacles to FMS, a pattern recognition system based on multi-layer perception neural network is developed and the performance of the system is experimentally evaluated. Experimental results show that recognition of the two class state of normal or abnormal cutting gives satisfactory results with success rate of 81`91%. Therefore, the proposed system has possibility for use in monitoring and diagnosis of automatic manufacturing system