제어로봇시스템학회:학술대회논문집
- 1989.10a
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- Pages.957-961
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- 1989
A built-in structure for pseudorandom testing of RAM
- Rao, Gururaj-K. (Faculty of Engineering, Kumamoto University) ;
- Kashiwagi, Hiroshi (Faculty of Engineering, Kumamoto University)
- Published : 1989.10.01
Abstract
This paper deals with test-pattern generation and diagnoses of pattern-sensitive faults in RAM by use of simple pseudorandom M-sequences with an emphasis to built-in structure of these schemes. The problems that may arise during their implementation are discussed and an approach to builtin testing of RAM by such a scheme is given not bothering too much about the silicon area required.
Keywords