대한전기학회:학술대회논문집 (Proceedings of the KIEE Conference)
- 대한전기학회 1989년도 하계종합학술대회 논문집
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- Pages.359-363
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- 1989
얇은 산화막의 Wear-out 현상과 제인자
The factors involved in the wear-out of the thin oxide film
- Kim, Jae-Ho (Department of Electrical Engineering, Korea University) ;
- Yi, Seung-Hwan (Department of Electrical Engineering, Korea University) ;
- Kim, Chun-Sub (Department of Electrical Engineering, Korea University) ;
- Sung, Yung-Kwon (Department of Electrical Engineering, Korea University)
- 발행 : 1989.07.21
초록
Recently, it is reported that the behavior of thermal
키워드