Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 1988.11a
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- Pages.164-167
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- 1988
Optical Recording Properties of $(Te_{86}Se_{14})_{50}Bi_{50}$ Thin Films with Trilayer Structure
삼중층 구조를 갖는 $(Te_{86}Se_{14})_{50}Bi_{50}$ 박막의 광기록 특성
- Kim, Byeong-Hoon (Dep. of Electronic Mat. Eng. Kwang Woon Univ.) ;
- Lee, Hyun-Yong (Dep. of Electronic Mat. Eng. Kwang Woon Univ.) ;
- Lee, Young-Jong (Dep. of Electronic Mat. Eng. Kwang Woon Univ.) ;
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Chung, Hong-Bae
(Dep. of Electronic Mat. Eng. Kwang Woon Univ.)
- Published : 1988.11.25
Abstract
This paper reports optical properties and hole formation of a 488nm-optimumed trilayer structure utiluzed Te-based thin films as a recording layer, and the application of trilayer to 830nm. The optical recording characteristics of metallic recording media are enhanced significantly by incoporating the metal (Al) layer into an antireflection trilayer structure. Due to the interference condition inherent in the design of the trilayer structure, reflectance from holes is ranked a low fraction. the hole formation is carried out by laser by
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