Perpendicular Magenetic Anisotropy in TbFeCo Magneto Optic Recording Thin Films

  • Lee, Yong-Ho- (Dept. Of Physics, Korea Advanced Institute of Science and Technology) ;
  • Lee, Sang-Soo- (Dept. Of Physics, Korea Advanced Institute of Science and Technology)
  • Published : 1988.06.01

Abstract

In order to clarify the origin of perpendicular anisotropy in thermally evaporated TbFeCo amorphous thin films, we have investigated the effects of deposition angle on magnetic Kerr hysteresis loop, perpendicular magnetic anisotropy and internal stress depend strongly on the deposition angle and above a threshold value(30$^{\circ}$), the perpendicular anisotropy disapperars and the in-plane anisotropy appears. The measurement of internal stress is the major contribution to the perpendicular anisotropy. The measurements of Kerr hysteresis loops in the polar and the longitudinal directions show that as the deposition angle increases the polar kerr hystresis loop deteriorates while the longitudinal Kerr hystersis loop becomes prominent.

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