Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 1988.07a
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- Pages.269-272
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- 1988
A study on the short-open testing algorithm of the PCB tester
PCB 검사기의 단락측정 알고리즘에 관한 연구
- Lee, Yong-Seok (Dept. of Electronics Eng., Ajou University) ;
- Joung, Hwa-Ja (Dept. of Electronics Eng., Ajou University) ;
- Kim, Yong-Deak (Dept. of Electronics Eng., Ajou University)
- Published : 1988.07.01
Abstract
This paper deals with the test strategy on the short-open for the printed circuit board. A group testing algorithm, which is the several testing point to be measured redefined as one of the testing points, was suggested. As a result, the total testing time was reduced to 30
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