대한전기학회:학술대회논문집 (Proceedings of the KIEE Conference)
- 대한전기학회 1987년도 정기총회 및 창립40주년기념 학술대회 학회본부
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- Pages.267-271
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- 1987
절연내력에 미치는 주변효과의 방지에 관한 연구
A Study on the prevention of edge effect reducing dielectric strength
- Kwak, Hee-Ro (Soong Sil Univ.) ;
- Shin, Hee-Yong (KEPCO)
- 발행 : 1987.11.20
초록
The test cell for preventing the edge effect reducing the intrinsic breakdown strength of polypropylene film and measuring the intrinsic breakdown strength of the film was developed. The new approach was to develope an electrode system with an edge region which is carefully graded over an extended distance. The new test arrangement employed a central circular electrode at high voltage and a set of nine concentric surrounding rings each controlled in potential by external grading resistors to be at decreasing potentials from that at the center in 10% increments. Two different size structures using the same basic principle were tried and were both found to be successful. The test electrodes were manufactured using standard printed circuit technology and were chosen to be copper on high dielectric constant GIO board.
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