Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 1987.11a
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- Pages.207-209
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- 1987
Degradation and hole formation of the Te-based thin films
Te을 기본으로 한 박막에서의 열화와 미세구멍형성에 관한 연구
- Lee, Hyun-Young (Kwang Woon Univ., Electronic Material Eng. Dep.) ;
- Park, Tae-Sung (Kwang Woon Univ., Electronic Material Eng. Dep.) ;
- Um, Jeong-Ho (Kwang Woon Univ., Electronic Material Eng. Dep.) ;
- Lee, Young-Jong (Kwang Woon Univ., Electronic Material Eng. Dep.) ;
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Chung, Hong-Bay
(Kwang Woon Univ., Electronic Material Eng. Dep.)
- 이현용 (광운대학 전자재료공학과) ;
- 박태성 (광운대학 전자재료공학과) ;
- 엄정호 (광운대학 전자재료공학과) ;
- 이영종 (광운대학 전자재료공학과) ;
-
정홍배
(광운대학 전자재료공학과)
- Published : 1987.11.20
Abstract
This paper reports the effect of additive elements such as Bi, Sb on degradation and hole formation of the Te-Se thin films. Changes in light transmission were used to monitor the degradation rate of thin Te films in an accelerated temperature-humidity environment. In thin accelerated temperature-humidity environment,
Keywords