Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 1987.07a
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- Pages.400-402
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- 1987
A STUDY ON EXITERNAL BIAS AND SURFACE POTENTIAL OF MOS DEVICE BY NUMERICAL ANALYSIS.
수치해석에 의한 MOS Device의 외부 Bias와 표면준위에 관한 일 고찰
- Joo, Yu-Jin (KOREA UNIVERSITY) ;
- Her, Yoon-Jong (KOREA UNIVERSITY) ;
- Sung, Young-Kwon (KOREA UNIVERSITY)
- Published : 1987.07.03
Abstract
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