Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 1987.07a
- /
- Pages.393-395
- /
- 1987
A indirect measuring method for impurity trap level in ZnO semiconductor
산화아연 반도 체내의 불순물 trap 준위에 대한 간접적 측정 방법
- Kim, Myung-Sik (KAIST) ;
-
Koo, Ja-Yoon
(KAIST)
;
- Oh, Myung-Hwan (KAIST)
- Published : 1987.07.03
Abstract
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