Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)

The Korean Institute of Electrical Engineers (대한전기학회)
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Extraction of Feature Points Using a Line-Edge Detector

선경계 검출에 의한 특징점 추출

  • Kim, Ji-Hong (Dept. of Electronics, Kyungpook National Univ.) ;
  • Kim, Nam-Chul (Dept. of Electronics, Kyungpook National Univ.)
  • 김지홍 (경북대학교 전자공학과) ;
  • 김남철 (경북대학교 전자공학과)
  • Published : 1987.07.03
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Abstract

The feature points of an image play a very important role in understanding the image. Especially, when an image is composed of lines, vertices of the image offer informations about its property and structure. In this paper, a series of process for extracting feature points from actual IC image is described. This result can be used to acquire CIF ( Caltech Intermediate Form ) file.

Keywords